Browsing by author "Magnusson, Ulf"
Now showing items 1-4 of 4
-
Low-frequency noise and DC characterization of ionization damage in a 1-µm SOI CMOS technology adapted for space applications
Simoen, Eddy; Magnusson, Ulf; Van den Bosch, Geert; Smeys, Peter; Colinge, Jean-Pierre; Claeys, Cor (1994) -
Mrad(Si) irradiation effects in gate-all-around silicon-on-insulator n-MOSFET's
Simoen, Eddy; Magnusson, Ulf; Born, Ivan; Vlummens, Jan; Claeys, Cor; Coenen, S.; Decreton, M. (1994) -
The kink-related excess low-frequency noise in silicon-on-insulator MOST's
Simoen, Eddy; Magnusson, Ulf; Rotondaro, Antonio; Claeys, Cor (1994) -
Transient effects in accumulation mode p-channel SOI MOSFETs operating at 77K
Martino, Joao Antonio; Rotondaro, Antonio; Simoen, Eddy; Magnusson, Ulf; Claeys, Cor (1994)