Browsing by author "Kayser, Stefan"

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Defect-induced stress imaging in single and multi-crystalline semiconductor materials

Herms, Martin; Wagner, Matthias; Kayser, Stefan; Kießling, Frank; Poklad, Anna; Zhao, Ming; Kretzer, Ulrich (2018)
Photo-elastic characterization of defect structures in mono and multi-crystalline semiconductor materials

Herms, Martin; Wagner, Matthias; Kayser, Stefan; Kießling, Frank; Poklad, Anna; Zhao, Ming; Kretzer, Ulrich (2016-09)