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Photo-elastic characterization of defect structures in mono and multi-crystalline semiconductor materials
Publication:
Photo-elastic characterization of defect structures in mono and multi-crystalline semiconductor materials
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Date
2016-09
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Herms, Martin
;
Wagner, Matthias
;
Kayser, Stefan
;
Kießling, Frank
;
Poklad, Anna
;
Zhao, Ming
;
Kretzer, Ulrich
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1853
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Acq. date: 2026-01-09
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Metrics
Views
1853
since deposited on 2021-10-23
4
last month
2
last week
Acq. date: 2026-01-09
Citations