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Photo-elastic characterization of defect structures in mono and multi-crystalline semiconductor materials
Publication:
Photo-elastic characterization of defect structures in mono and multi-crystalline semiconductor materials
Date
2016-09
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Herms, Martin
;
Wagner, Matthias
;
Kayser, Stefan
;
Kießling, Frank
;
Poklad, Anna
;
Zhao, Ming
;
Kretzer, Ulrich
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Abstract
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1847
since deposited on 2021-10-23
Acq. date: 2025-10-28
Citations
Metrics
Views
1847
since deposited on 2021-10-23
Acq. date: 2025-10-28
Citations