Browsing by author "Gornik, E."
Now showing items 1-4 of 4
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Detailed study of the parasitic geometric current components in charge pumping measurements: determination of relevant parameters
Habas, Predrag; Groeseneken, Guido; Van den Bosch, Geert; Maes, Herman; Gornik, E. (1997) -
Optical testing of submicron-technology MOSFETs and bipolar transistors
Pogany, D.; Fürböck, C.; Seliger, N.; Habas, Predrag; Gornik, E.; Kubicek, Stefan; Decoutere, Stefaan (1997) -
Test circuits for fast and reliable assessment if CDM robustness of I/O stages
Stadler, W.; Esmark, K.; Reynders, K.; Zubeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, D.; Mettler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Groeseneken, Guido; Morena, E.; Stella, I.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M. (2005) -
Test circuits for fast and reliable assessment of CDM robustness of I/O stages
Stadler, Wolfgang; Esmark, K.; Reynders, K.; Zuhbeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, S.; Settler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Groeseneken, Guido; Morena, E.; Stella, R.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M. (2003)