Browsing by author "Bernardini, S."
Now showing items 1-4 of 4
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Effect of fixed dielectric charges on tunnelling transparency in MIM and MIS structures
Bernardini, S.; Masson, P.; Houssa, Michel (2004) -
Extrinsic stacking fault generation related to high-k dielectric growth on a Si substrate
Volkos, S.N.; Bernardini, S.; Rigopoulos, N.; Efthymiou, E.S.; Hawkins, I.D.; Hamilton, B.; Dobaczewski, L.; Hall, S.; Hurley, P.K; Delabie, Annelies; Peaker, A.R (2007) -
Nanoscale imaging and x-ray spectroscopy of electrically active defects in ultra thin dielectrics on silicon
Bernardini, S.; Ishii, M.; Whittaker, E.; Hamilton, B.; Freeland, C.; Poolton, N.R.J.; De Gendt, Stefan (2007) -
Origin and repartition of the oxide fixed charges generated by electrical stress in memory tunnel oxide
Bernardini, S.; Masson, P.; Houssa, Michel; Lalande, F. (2004)