Browsing by author "Nieddu, Thomas"
Now showing items 1-3 of 3
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Bandgap measurement by spectroscopic ellipsometry for strained Ge 1-x Sn x
Shimura, Yosuke; Wang, Wei; Nieddu, Thomas; Gencarelli, Federica; Vincent, Benjamin; Laha, Priya; Terryn, Herman; Stefanov, Stefan; Chiussi, Stefano; Van Campenhout, Joris; Nguyen, Ngoc Duy; Vantomme, Andre; Loo, Roger (2013-06) -
Composition and thickness dependence of GeSn growth by chemical vapor deposition
Wang, Wei; Shimura, Yosuke; Nieddu, Thomas; Gencarelli, Federica; Nguyen, Duy; Vandervorst, Wilfried; Loo, Roger (2013-06) -
Theoretical and experimental investigation of the GeSn bandgap
Shimura, Yosuke; Wang, Wei; Gencarelli, Federica; Vincent, Benjamin; Nieddu, Thomas; Laha, Priya; Terryn, Herman; Stefanov, Stefan; Chiussi, Stefano; Van Campenhout, Joris; Nguyen, Ngoc Duy; Vantomme, Andre; Loo, Roger (2013)