Bandgap measurement by spectroscopic ellipsometry for strained Ge 1-x Sn x

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Authors
Shimura, Yosuke; Wang, Wei; Nieddu, Thomas; Gencarelli, Federica; Vincent, Benjamin; Laha, Priya; Terryn, Herman; Stefanov, Stefan; Chiussi, Stefano; Van Campenhout, Joris; Nguyen, Ngoc Duy; Vantomme, Andre; Loo, Roger
Conference
8th International conference on Silicon Epitaxy and Heterostructures - ICSI-8
Title
Bandgap measurement by spectroscopic ellipsometry for strained Ge 1-x Sn x
Publication type
Proceedings paper
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