Bandgap measurement by spectroscopic ellipsometry for strained Ge 1-x Sn x

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Author(s)

Shimura, Yosuke

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Gencarelli, Federica

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Vincent, Benjamin

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Stefanov, Stefan

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Chiussi, Stefano

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Van Campenhout, Joris

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Nguyen, Ngoc Duy

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Vantomme, Andre

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Metrics

1943 since deposited on 2021-10-21

Acq. date: 2025-10-24