Browsing by author "Yao, T."
Now showing items 1-2 of 2
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Method for endurance optimization of the HIMOStm flash memory cell in a 90nm CMOS technology
Yao, T.; Lowe, A.; Vermeulen, T.; Bellafiore, N.; Van Houdt, Jan; Wellekens, Dirk (2005) -
Plasma damage in HIMOSTM non-volatile memories (NVM)
Ackaert, J.; Lowe, A.; De Backer, E.; Boonen, S.; Yao, T.; Van Houdt, Jan; Haspeslagh, Luc (2004-05)