Browsing by author "Galloway, Ken"
Now showing items 1-2 of 2
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Interface and border traps in Ge pMOSFETs
Fleetwood, Daniel; Simoen, Eddy; Francis, Sarah; Zhang, C.X.; Arora, R.; Zhang, E.X.; Schrimpf, Ronald; Galloway, Ken; Mitard, Jerome; Claeys, Cor (2012) -
Total-dose-irradiation and annealing responses of Ge-pMOSFETs
Zhang, C.X.; Zhang, E.X.; Fleetwood, Dan; Schrimpf, Ron; Galloway, Ken; Simoen, Eddy; Mitard, Jerome; Claeys, Cor (2010)