Interface and border traps in Ge pMOSFETs

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Authors
Fleetwood, Daniel; Simoen, Eddy; Francis, Sarah; Zhang, C.X.; Arora, R.; Zhang, E.X.; Schrimpf, Ronald; Galloway, Ken; Mitard, Jerome; Claeys, Cor
Conference
ECS Fall Meeting Symposium E6: High Purity Silicon 12
Title
Interface and border traps in Ge pMOSFETs
Publication type
Meeting abstract
Embargo date
9999-12-31
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