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Interface and border traps in Ge pMOSFETs
Publication:
Interface and border traps in Ge pMOSFETs
Date
2012
Meeting abstract
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24804.pdf
116.08 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fleetwood, Daniel
;
Simoen, Eddy
;
Francis, Sarah
;
Zhang, C.X.
;
Arora, R.
;
Zhang, E.X.
;
Schrimpf, Ronald
;
Galloway, Ken
;
Mitard, Jerome
;
Claeys, Cor
Journal
Abstract
Description
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Views
2002
since deposited on 2021-10-20
469
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
2002
since deposited on 2021-10-20
469
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations