Browsing by author "Ceric, H."
Now showing items 1-4 of 4
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A framework for combined simulations of electromigration induced stress evolution, void nucleation, and its dynamics: Application to nano-interconnect reliability
Saleh, Ahmed; Croes, Kristof; Ceric, H.; De Wolf, Ingrid; Zahedmanesh, Houman (2023) -
Electromigration-induced void evolution and failure of Cu/SiCN hybrid bonds
Ceric, H.; Zahedmanesh, Houman; Croes, Kristof; Lacerda de Orio, R.; Selberherr, S. (2023) -
Review-Modeling Methods for Analysis of Electromigration Degradation in Nano-Interconnects
Ceric, H.; Selberherr, S.; de Orio, R. L.; Zahedmanesh, Houman; Croes, Kristof (2021) -
Void-dynamics in nano-wires and the role of microstructure investigated via a multi-scale physics-based model
Saleh, Ali; Ceric, H.; Zahedmanesh, Houman (2021)