Browsing by author "Tegude, F. J."

Now showing items 1-1 of 1

A new consistent RF- and noise model with special emphasis on impact ionization for dual-gate HFET in cascode configuration

Breder, T.; Reuter, R.; Daumann, W.; Schreurs, Dominique; van der Zanden, Koen; Brockerhoff, W.; Tegude, F. J. (1998)