Browsing by author "Resinger, Hans"
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Experimental characterization of BTI defects
Kaczer, Ben; Afanasiev, Valeri; Rott, Karina; Cerbu, F.; Franco, Jacopo; Grasser, Tibor; Madia, O.; Nguyen, A. P. D.; Stesmans, Andre; Resinger, Hans; Toledano Luque, Maria; Weckx, Pieter (2013) -
Gate-sided hydrogen release as the origin of "permanent" NBTI degradation: from single defects to lifetimes
Grasser, Tibor; Waltl, Michael; Wimmer, Yannick; Goes, Wolfgang; Kosik, R.; Rzepa, Gerhard; Resinger, Hans; Pobegen, Gregor; El-Sayed, A.; Shluger, A.; Kaczer, Ben (2015) -
SrTiO3 for sub-20 nm DRAM technology nodes – characterization and modeling
Kaczer, Ben; Larcher, Luca; Vandelli, Luca; Resinger, Hans; Popovici, Mihaela Ioana; Clima, Sergiu; Ji, Zhigang; Joshi, Saumya; Swerts, Johan; Redolfi, Augusto; Afanasiev, Valeri; Jurczak, Gosia (2014)