Authors

Kaczer, Ben; Afanasiev, Valeri; Rott, Karina; Cerbu, F.; Franco, Jacopo; Grasser, Tibor; Madia, O.; Nguyen, A. P. D.; Stesmans, Andre; Resinger, Hans; Toledano Luque, Maria; Weckx, Pieter

Conference

SISPAD Satellite Workshop: Modelling of Reliability and Degradation of Nanoelectronic Devices

Title

Experimental characterization of BTI defects

Publication type

Proceedings paper