Publication:

Experimental characterization of BTI defects

Date

2013
Proceedings Paper
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dc.contributor.authorKaczer, Ben
dc.contributor.authorAfanasiev, Valeri
dc.contributor.authorRott, Karina
dc.contributor.authorCerbu, F.
dc.contributor.authorFranco, Jacopo
dc.contributor.authorGrasser, Tibor
dc.contributor.authorMadia, O.
dc.contributor.authorNguyen, A. P. D.
dc.contributor.authorStesmans, Andre
dc.contributor.authorResinger, Hans
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorStesmans, Andre
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.date.accessioned2021-10-21T08:38:27Z
dc.date.available2021-10-21T08:38:27Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22561
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6650670&queryText%3DExperimental+characterization+of+BTI+defects
dc.source.beginpage444
dc.source.conferenceSISPAD Satellite Workshop: Modelling of Reliability and Degradation of Nanoelectronic Devices
dc.source.conferencedate3/09/2013
dc.source.conferencelocationGlasgow Scotland
dc.source.endpage450
dc.title

Experimental characterization of BTI defects

dc.typeProceedings paper
dspace.entity.typePublication
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