Browsing by author "Prabhakara, Viveksharma"
Now showing items 1-3 of 3
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HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale
Jannis, D.; Guzzinati, G.; Beche, A.; Verbeeck, J.; Prabhakara, Viveksharma; Bender, Hugo (2020) -
Linearized radially polarized light for improved precision in strain measurements using micro-Raman spectroscopy
Bals, S.; Verbeeck, J.; Prabhakara, Viveksharma; Nuytten, Thomas; Bender, Hugo; Vandervorst, Wilfried (2021) -
Strain measurement in semiconductor FinFET devices using a novel moiré demodulation technique
Prabhakara, Viveksharma; Jannis, Daen; Béché, Armand; Bender, Hugo; Verbeeck, Johan (2020)