Browsing by author "Verstraeten, K."

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Analysis of trace metals in thin silicon nitride films by total-reflection X-ray fluorescence

Vereecke, Guy; Arnauts, Sophia; Van Doorne, Patrick; Kenis, Karine; Onsia, Bart; Verstraeten, K.; Schaekers, Marc; Van Hoeymissen, Jan; Heyns, Marc (2001)