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    • Study of 3D process impact on advanced CMOS devices 

      La Manna, Antonio; Guo, Wei; Van Huylenbroeck, Stefaan; Sirignano, Emilio; Cherman, Vladimir; Van der Plas, Geert; De Wachter, Bart; Phommahaxay, Alain; Jourdain, Anne; Beyer, Gerald; Beyne, Eric (2013)