Browsing by author "Salm, C."
Now showing items 1-3 of 3
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Correlation between hot carrier stress, oxide breakdown and gate leakage current for monitoring plasma processing induced damage on gate oxide
Zhichun, Wang; Ackaert, J.; Salm, C.; de Backer, E.; Van den Bosch, Geert; Zawalski, Wade (2002) -
Mechanical stress evolution and the Blech length: 2D simulation of early electromigration effects
Petrescu, Violeta; Mouthaan, T.; Schoenmaker, Wim; Salm, C. (1998) -
Mechanical stress evolution and the Blech length: 2D simulation of early electromigration effects
Petrescu, Violeta; Mouthaan, T.; Schoenmaker, Wim; Salm, C. (1998)