Browsing by author "Waldhoer, D."
Now showing items 1-2 of 2
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Atomic Hydrogen Exposure to Enable High-Quality Low-Temperature SiO2 with Excellent pMOS NBTI Reliability Compatible with 3D Sequential Tier Stacking
Franco, Jacopo; de Marneffe, Jean-Francois; Vandooren, Anne; Kimura, Yosuke; Nyns, Laura; Wu, Zhicheng; El-Sayed, A-M; Jech, M.; Waldhoer, D.; Claes, Dieter; Arimura, Hiroaki; Ragnarsson, Lars-Ake; Afanas'ev, V.; Stesmans, A.; Horiguchi, Naoto; Linten, Dimitri; Grasser, T.; Kaczer, Ben (2020) -
Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS
Michl, J.; Grill, Alexander; Stampfer, B.; Waldhoer, D.; Schleich, C.; Knobloch, T.; Ioannidis, E.; Enichlmair, H.; Minixhofer, R.; Kaczer, Ben; Parvais, Bertrand; Govoreanu, Bogdan; Radu, Iuliana; Grasser, T.; Waltl, M. (2021)