Browsing by author "Croes, K."
Now showing items 1-5 of 5
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Analytical bounds for the MLE of the Weibull shape parameter
Andries, E.; Croes, K.; De Ceuninck, Ward; De Schepper, Luc; Molenberghs, G. (2002) -
Application of general finite mixture models to reliability data using likelihood estimation
Andries, E.; Croes, K.; De Schepper, Luc; Molenberghs, G. (2003) -
Moisture induced failures in flip chip on flex interconnections using anisotropic conductive adhesives
Caers, J.F.J.M.; Zhao, X.J.; Lekens, Geert; Dreesen, R.; Croes, K.; Wong, E.H. (2003) -
Statistical aspects of the degradation of LDD nMOSFETs
Andries, E.; Dreesen, R.; Croes, K.; De Ceuninck, Ward; De Schepper, Luc; Groeseneken, Guido; Lo, K.F.; D'Olieslaeger, Marc; D'Haen, Jan (2002) -
The use of random effects in modeling non-linear hot-carrier degradation data
Andries, E.; Croes, K.; Dreesen, R.; De Ceuninck, Ward; De Schepper, Luc (2002)