Statistical aspects of the degradation of LDD nMOSFETs

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Authors

Andries, E.; Dreesen, R.; Croes, K.; De Ceuninck, Ward; De Schepper, Luc; Groeseneken, Guido; Lo, K.F.; D'Olieslaeger, Marc; D'Haen, Jan

Issue

9_11

Journal

Microelectronics Reliability

Volume

42

Title

Statistical aspects of the degradation of LDD nMOSFETs

Publication type

Journal article

Embargo date

9999-12-31

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