Publication:

Statistical aspects of the degradation of LDD nMOSFETs

Date

2002
Journal article
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Author(s)

Andries, E.
;
Dreesen, R.
;
Croes, K.
;
De Ceuninck, Ward  
;
De Schepper, Luc
;
Groeseneken, Guido  
;
Lo, K.F.
;
D'Olieslaeger, Marc  
;
D'Haen, Jan  

Journal

Microelectronics Reliability

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