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Articles
Statistical aspects of the degradation of LDD nMOSFETs
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Statistical aspects of the degradation of LDD nMOSFETs
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Date
2002
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Andries, E.
;
Dreesen, R.
;
Croes, K.
;
De Ceuninck, Ward
;
De Schepper, Luc
;
Groeseneken, Guido
;
Lo, K.F.
;
D'Olieslaeger, Marc
;
D'Haen, Jan
Journal
Microelectronics Reliability
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Views
2024
since deposited on 2021-10-14
2
last month
1
last week
Acq. date: 2025-12-10
Citations