Browsing by author "Whall, T."
Now showing items 1-3 of 3
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Low-frequency noise characterizations of strained germanium pMOSFETs
Simoen, Eddy; Mitard, Jerome; De Jaeger, Brice; Eneman, Geert; Dobbie, A.; Myronov, M.; Whall, T.; Leadly, D.; Meuris, Marc; Hoffmann, Thomas Y.; Claeys, Cor (2011) -
TEM analysis of Ge-on-Si MOSFET structures with HfO2 dielectric for high performance PMOS device technology
Norris, D.J.; Walther, T.; Cullis, A.G.; Myronov, M.; Dobbie, A.; Whall, T.; Parker, E.H.C.; Leadley, D.R.; De Jaeger, Brice; Lee, Willie; Meuris, Marc; Watling, J.; Asenov, A. (2010) -
TEM analysis of Si-passivated Ge-on-Si MOSFET structures for high performance PMOS device technology
Norris, D.J.; Ross, I.M.; Cullis, A.G.; Walther, T.; Myronov, M.; Dobbie, A.; Whall, T.; Parker, E.H.C.; Leadley, D.R.; De Jaeger, Brice; Lee, Willie; Meuris, Marc (2010)