Browsing by author "Vexler, M.I."
Now showing items 1-1 of 1
-
A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer NMOSFETs
Sharma, P.; Tyaginov, S.; Rauch, S.E.; Franco, Jacopo; Kaczer, Ben; Makarov, A.; Vexler, M.I.; Grasser, T. (2016)