Browsing by author "Lee, Frank"
Now showing items 1-2 of 2
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DfT architecture and ATPG for interconnect tests of JEDEC wide-IO memory-on-logic die stacks
Deutsch, Sergej; Keller, Brion; Chickermane, Vivek; Mukherjee, Subhasish; Sood, Navdeep; Goel, Sandeep K.; Chen, Ji-Jan; Mehta, Ashok; Lee, Frank; Marinissen, Erik Jan (2012-11) -
Test and debug strategy for TSMC CoWoS stacking process-based heterogeneous 3D-IC: A silicon study
Goel, Sandeep K.; Adham, Saman; Wang, Min-Jer; Lee, Frank; Chickermane, Vivek; Keller, Brion; Valind, Thomas; Marinissen, Erik Jan (2019-03)