Browsing by author "Boedt, F."

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Analysis of sense margin and reliability of 1T-DRAM fabricated on thin-film UTBOX substrates

Collaert, Nadine; Aoulaiche, Marc; Rakowski, Michal; De Wachter, Bart; Bourdelle, K.; Nguyen, B.-Y.; Boedt, F.; Delprat, D.; Jurczak, Gosia (2009)
Reliability and retention of 1T-RAM cell capacitor less on UTBOX SOI substrates

Aoulaiche, Marc; Collaert, Nadine; Simoen, Eddy; Mercha, Abdelkarim; De Wachter, Bart; Bourdelle, K.K.; Nguyen, B.-Y.; Boedt, F.; Delprat, D.; Jurczak, Gosia; Altimime, Laith (2010)