Browsing by author "Seifert, W."
Now showing items 1-7 of 7
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EBIC study of recombination activity of oxygen precipitation related defects in Si
Seifert, W.; Kittler, M.; Vanhellemont, Jan (1996) -
Electrical properties of SiGe epitaxial layers for photovoltaic application as studied by scanning electron microscopical methods
Kruger, O.; Seifert, W.; Kittler, M.; Gutjahr, A.; Konuma, M.; Said, Khalid; Poortmans, Jef (1998) -
Electrical properties of SiGe layers grown by LPE and CVD
Kruger, O.; Seifert, W.; Kittler, M.; Gutjahr, A.; Silier, I.; Konuma, M.; Said, Khalid; Caymax, Matty; Poortmans, Jef (1998) -
Low-temperature passivation for SiGe-alloy solar cells
Said, Khalid; Poortmans, Jef; Libezny, Milan; Caymax, Matty; Nijs, Johan; Mertens, Robert; Vinckier, Chris; Vyncke, Dominique; Seifert, W.; Kittler, M.; Silier, I.; Gutjahr, A.; Konuma, M. (1997) -
Recombination activity of oxygen precipitation related defects in Si
Seifert, W.; Kittler, M.; Vanhellemont, Jan; Simoen, Eddy; Claeys, Cor; Kirscht, F. G. (1996) -
SiGe thin-film structures for solar cells
Brémond, G.; Daami, A.; Laugier, A.; Seifert, W.; Kittler, M.; Poortmans, Jef; Caymax, Matty; Said, Khalid; Konuma, M.; Gutjahr, A.; Silier, I. (1998) -
Study of oxygen related recombination defects in Si by temperature-dependent lifetime and EBIC measurements
Gaubas, Eugenijus; Vanhellemont, Jan; Simoen, Eddy; Claeys, Cor; Seifert, W. (1997)