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Electrical properties of SiGe epitaxial layers for photovoltaic application as studied by scanning electron microscopical methods
Publication:
Electrical properties of SiGe epitaxial layers for photovoltaic application as studied by scanning electron microscopical methods
Date
1998
Proceedings Paper
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2692.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kruger, O.
;
Seifert, W.
;
Kittler, M.
;
Gutjahr, A.
;
Konuma, M.
;
Said, Khalid
;
Poortmans, Jef
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1900
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Acq. date: 2025-10-24
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Metrics
Views
1900
since deposited on 2021-09-30
428
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations