Authors

Kruger, O.; Seifert, W.; Kittler, M.; Gutjahr, A.; Konuma, M.; Said, Khalid; Poortmans, Jef

Conference

Beam Injection Assessment of Defects in Semiconductors - BIADS. Proceeding of the 5th International Workshop

Title

Electrical properties of SiGe epitaxial layers for photovoltaic application as studied by scanning electron microscopical methods

Publication type

Proceedings paper

Embargo date

9999-12-31