Browsing by author "Aichinger, T."
Now showing items 1-3 of 3
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Analytic modeling of the bias temperature instability using capture/emission time maps
Grasser, Tibor; Wagner, Paul-Jurgen; Reisinger, Hans; Aichinger, T.; Pobegen, G.; Nelhiebel, M.; Kaczer, Ben (2011-12) -
Defect creation stimulated by thermally activated hole trapping as the driving force behind negative bias temperature instability in SiO2, SiON, and high-k gate stacks
Grasser, T.; Kaczer, Ben; Aichinger, T.; Goes, W.; Nelhiebel, M. (2008) -
Understanding negative bias temperature instability in the context of hole trapping
Grasser, T.; Kaczer, Ben; Goes, W.; Aichinger, T.; Hehenberger, P.; Nelhiebel, M. (2009)