Understanding negative bias temperature instability in the context of hole trapping

View/open

19795.pdf (516.2Kb)

Metadata

Show full item record

Authors

Grasser, T.; Kaczer, Ben; Goes, W.; Aichinger, T.; Hehenberger, P.; Nelhiebel, M.

ISSN

0167-9317

Issue

7_9

Journal

Microelectronic Engineering

Volume

86

Title

Understanding negative bias temperature instability in the context of hole trapping

Publication type

Journal article

Embargo date

9999-12-31

Collections

Articles