Understanding negative bias temperature instability in the context of hole trapping

dc.contributor.author	Grasser, T.
dc.contributor.author	Kaczer, Ben
dc.contributor.author	Goes, W.
dc.contributor.author	Aichinger, T.
dc.contributor.author	Hehenberger, P.
dc.contributor.author	Nelhiebel, M.
dc.contributor.imecauthor	Kaczer, Ben
dc.contributor.orcidimec	Kaczer, Ben::0000-0002-1484-4007
dc.date.accessioned	2021-10-17T22:32:13Z
dc.date.available	2021-10-17T22:32:13Z
dc.date.embargo	9999-12-31
dc.date.issued	2009
dc.identifier.issn	0167-9317
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/15390
dc.source.beginpage	1876
dc.source.endpage	1882
dc.source.issue	7_9
dc.source.journal	Microelectronic Engineering
dc.source.volume	86
dc.title	Understanding negative bias temperature instability in the context of hole trapping
dc.type	Journal article
dspace.entity.type	Publication
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