Browsing by author "Acurio, Eliana"
Now showing items 1-2 of 2
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A compact model based on the Lambert function for AlGaN/GaN Schottky barrier gated-edge termination
Trojman, Lionel; Acurio, Eliana; De Jaeger, Brice; Posthuma, Niels; Decoutere, Stefaan; Bakeroot, Benoit (2023) -
ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric
Acurio, Eliana; Trojman, Lionel; De Jaeger, Brice; Bakeroot, Benoit; Decoutere, Stefaan (2021)