Publication:

ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric

Date

2021

Proceedings Paper

https://doi.org/10.1109/IRPS46558.2021.9405163

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Author(s)

;

Trojman, Lionel

;

De Jaeger, Brice

;

Bakeroot, Benoit

;

Decoutere, Stefaan

Journal

na

Statistics

1834 since deposited on 2022-03-11

Acq. date: 2026-02-25