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ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric
Publication:
ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric
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Date
2021
Proceedings Paper
https://doi.org/10.1109/IRPS46558.2021.9405163
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Acurio, Eliana
;
Trojman, Lionel
;
De Jaeger, Brice
;
Bakeroot, Benoit
;
Decoutere, Stefaan
Journal
na
Abstract
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1834
since deposited on 2022-03-11
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last month
Acq. date: 2025-12-15
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Metrics
Views
1834
since deposited on 2022-03-11
2
last month
Acq. date: 2025-12-15
Citations