Publication:
ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric
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1831 since deposited on 2022-03-11
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Acq. date: 2025-10-24
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Views
1831 since deposited on 2022-03-11
437item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations