Browsing by author "Schrimpf, Ron"
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Radiation effects in advanced multiple-gate and silicon-on-insulator transistors
Simoen, Eddy; Gaillardin, Marc; Paillet, Philippe; Reed, Robert; Schrimpf, Ron; Alles, Michael; El-Mamouni, Farah; Fleetwood, Daniel; Griffoni, Alessio; Claeys, Cor (2013) -
Total-dose-irradiation and annealing responses of Ge-pMOSFETs
Zhang, C.X.; Zhang, E.X.; Fleetwood, Dan; Schrimpf, Ron; Galloway, Ken; Simoen, Eddy; Mitard, Jerome; Claeys, Cor (2010) -
X-Ray and proton radiation effects on 40 nm CMOS physically unclonable function devices
Wang, Pengfei; Zhang, Enxia; Chuang, Kent; Liao, Wenjun; Gong, Huiqi; Wang, Pan; Arutt, Charles N; Ni, Kai; McCurdy, Mike; Verbauwhede, Ingrid; Bury, Erik; Linten, Dimitri; Fleetwood, Daniel; Schrimpf, Ron; Reed, Robert (2018)