X-Ray and proton radiation effects on 40 nm CMOS physically unclonable function devices

Wang, Pengfei; Zhang, Enxia; Chuang, Kent; Liao, Wenjun; Gong, Huiqi; Wang, Pan; Arutt, Charles N; Ni, Kai; McCurdy, Mike; Verbauwhede, Ingrid; Bury, Erik; Linten, Dimitri; Fleetwood, Daniel; Schrimpf, Ron; Reed, Robert

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X-Ray and proton radiation effects on 40 nm CMOS physically unclonable function devices

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2018

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IEEE Transactions on Nuclear Science

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2104 since deposited on 2021-10-26

Acq. date: 2026-04-26

X-Ray and proton radiation effects on 40 nm CMOS physically unclonable function devices

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