X-Ray and proton radiation effects on 40 nm CMOS physically unclonable function devices

Wang, Pengfei; Zhang, Enxia; Chuang, Kent; Liao, Wenjun; Gong, Huiqi; Wang, Pan; Arutt, Charles N; Ni, Kai; McCurdy, Mike; Verbauwhede, Ingrid; Bury, Erik; Linten, Dimitri; Fleetwood, Daniel; Schrimpf, Ron; Reed, Robert

Publication:

X-Ray and proton radiation effects on 40 nm CMOS physically unclonable function devices

Date

2018

Journal article

Simple item page Full metadata Statistics

Author(s)

;

;

;

;

;

;

;

;

;

;

;

;

;

;

Journal

IEEE Transactions on Nuclear Science

Metrics

2097 since deposited on 2021-10-26

2last month

Acq. date: 2025-12-10

X-Ray and proton radiation effects on 40 nm CMOS physically unclonable function devices

Date

Author(s)

Journal

Abstract

Description

Metrics

Views

Citations

Metrics

Views

Citations