Browsing by author "Nishi, Yoshio"
Now showing items 1-5 of 5
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Ab initio modeling of oxygen-vacancy formation in doped-HfOx RRAM: effects of oxide phases, stoichiometry and dopant concentrations
Liang, Zhao; Clima, Sergiu; Magyari-Köpe, Blanka; Jurczak, Gosia; Nishi, Yoshio (2015) -
Experimental demonstration of high source velocity and its enhancement by uniaxial stress in Ge PFETs
Kobabyashi, Masaharu; Mitard, Jerome; Irisawa, Toshihumi; Hoffmann, Thomas Y.; Meuris, Marc; Saraswat, Krishna; Nishi, Yoshio; Heyns, Marc (2010) -
On the high-field transport and uniaxial stress effect in Ge PFETs
Kobayashi, Masaharu; Mitard, Jerome; Irisawa, Toshifumi; Hoffmann, Thomas Y.; Meuris, Marc; Saraswat, Krishna; Nishi, Yoshio; Heyns, Marc (2011) -
The effects of VUV radiation on low-k organosilicate glass (SiCOH) as measured with electron-spin resonance
Xue, Panpan; Zheng, Huifeng; Li, Weiyi; de Marneffe, Jean-Francois; Baklanov, Mikhaïl; Afanasiev, Valeri; Nishi, Yoshio; Shohet, J.Leon (2015) -
Theory and experiments of the impact of work function variability on threshold voltage variability in MOS devices
Zhang, Xiao; Mitard, Jerome; Ragnarsson, Lars-Ake; Hoffmann, Thomas Y.; Deal, Michael; Grubbs, M.E.; Li, Jing; Magyari-Kope, B.; Clemens, Bruce; Nishi, Yoshio (2012)