Browsing by author "Czurratis, Peter"

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Defect detection in through silicon vias by GHz scanning acoustic microscopy: key ultrasonic characteristics

Phommahaxay, Alain; De Wolf, Ingrid; Djuric, Tatjana; Hoffrogge, Peter; Brand, Sebastien; Czurratis, Peter; Philipsen, Harold; Beyer, Gerald; Struyf, Herbert; Beyne, Eric (2014)
Failure and stress analysis of Cu TSVs using

De Wolf, Ingrid; Khaled, Ahmad; Herms, Martin; Wagner, Matthias; Djuric, Tatjana; Czurratis, Peter; Brand, Sebastian (2015)