Authors

Phommahaxay, Alain; De Wolf, Ingrid; Djuric, Tatjana; Hoffrogge, Peter; Brand, Sebastien; Czurratis, Peter; Philipsen, Harold; Beyer, Gerald; Struyf, Herbert; Beyne, Eric

Conference

IEEE 64th Electronic Components and Technology Conference - ECTC

Title

Defect detection in through silicon vias by GHz scanning acoustic microscopy: key ultrasonic characteristics

Publication type

Proceedings paper