Publication:

Defect detection in through silicon vias by GHz scanning acoustic microscopy: key ultrasonic characteristics

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1920 since deposited on 2021-10-22
1last month
1last week
Acq. date: 2026-08-07

Citations

Statistics

Views

1920 since deposited on 2021-10-22
1last month
1last week
Acq. date: 2026-08-07

Citations