Browsing by author "Duvvury, C."
Now showing items 1-1 of 1
-
Impact of strain on ESD robustness of FinFET devices
Griffoni, Alessio; Thijs, Steven; Russ, C.; Trémouilles, David; Scholz, Mirko; Linten, Dimitri; Collaert, Nadine; Rooyackers, Rita; Duvvury, C.; Gossner, H.; Meneghesso, G.; Groeseneken, Guido (2008)