Publication:

Impact of strain on ESD robustness of FinFET devices

Date

2008
Proceedings Paper
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16642.pdf 321.87 KB

Author(s)

Griffoni, Alessio
;
Thijs, Steven  
;
Russ, C.
;
Trémouilles, David
;
Scholz, Mirko
;
Linten, Dimitri  
;
Collaert, Nadine  
;
Rooyackers, Rita
;
Duvvury, C.
;
Gossner, H.
;
Meneghesso, G.
;
Groeseneken, Guido  

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