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Impact of strain on ESD robustness of FinFET devices
Publication:
Impact of strain on ESD robustness of FinFET devices
Date
2008
Proceedings Paper
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16642.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Griffoni, Alessio
;
Thijs, Steven
;
Russ, C.
;
Trémouilles, David
;
Scholz, Mirko
;
Linten, Dimitri
;
Collaert, Nadine
;
Rooyackers, Rita
;
Duvvury, C.
;
Gossner, H.
;
Meneghesso, G.
;
Groeseneken, Guido
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1877
since deposited on 2021-10-17
Acq. date: 2025-10-24
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Downloads
1
since deposited on 2021-10-17
Acq. date: 2025-10-24
Views
1877
since deposited on 2021-10-17
Acq. date: 2025-10-24
Citations