Browsing by author "Brüner, Philipp"

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High resolution depth profile analysis of ultra-thin STO/TiN layers on Si by LEIS

Brongersma, Hidde; Bauer, Peter; Brüner, Philipp; Grehl, Thomas; Van den Berg, Jaap; Adelmann, Christoph (2012)
Low Energy Ion Scattering (LEIS) analysis of ultra-thin Ru layers on Ta- or Mn-based barriers

Brüner, Philipp; Grehl, T.; Jourdan, Nicolas; Steinbauer, E.; Bauer, P.; Brongersma, H. (2015)