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Low Energy Ion Scattering (LEIS) analysis of ultra-thin Ru layers on Ta- or Mn-based barriers
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Low Energy Ion Scattering (LEIS) analysis of ultra-thin Ru layers on Ta- or Mn-based barriers
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Date
2015
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31624.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Brüner, Philipp
;
Grehl, T.
;
Jourdan, Nicolas
;
Steinbauer, E.
;
Bauer, P.
;
Brongersma, H.
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since deposited on 2021-10-22
Acq. date: 2026-01-06
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1
since deposited on 2021-10-22
Acq. date: 2026-01-06
Views
1888
since deposited on 2021-10-22
Acq. date: 2026-01-06
Citations