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Low Energy Ion Scattering (LEIS) analysis of ultra-thin Ru layers on Ta- or Mn-based barriers
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Authors
Brüner, Philipp
;
Grehl, T.
;
Jourdan, Nicolas
;
Steinbauer, E.
;
Bauer, P.
;
Brongersma, H.
Conference
15th International Conference on Atomic Layer Deposition - ALD
Title
Low Energy Ion Scattering (LEIS) analysis of ultra-thin Ru layers on Ta- or Mn-based barriers
Publication type
Meeting abstract
Embargo date
9999-12-31
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