Browsing by author "Misra, D."
Now showing items 1-7 of 7
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Effect of nitridation on l/f noise in n-MOSFETs with high-k dielectric
Srinivasan, Purushothaman; Simoen, Eddy; Pantisano, Luigi; Claeys, Cor; Misra, D. (2005) -
Gate-dielectric interface effects in low frequency (1/f) noise in p-MOSFETs with high-K dielectrics
Srinivasan, Purushothaman; Simoen, Eddy; Singanamalla, Raghunath; Yu, HongYu; Claeys, Cor; Misra, D. (2005) -
Impact of gate material on low-frequency noise of n-MOSFETs with 1.5 nm SiON gate dielectric: testing the limits of the number fluctuations theory
Srinivasan, Purushothaman; Simoen, Eddy; Pantisano, Luigi; Claeys, Cor; Misra, D. (2005) -
Impact of high-K gate stack material with metal gates on LF noise in n- and p MOSFETs
Srinivasan, Purushothaman; Simoen, Eddy; Pantisano, Luigi; Claeys, Cor; Misra, D. (2005) -
Impact of the gate-electrode/dielectric interface on the low-frequency noise of thin gate oxide n-channel metal-oxide-semiconductor field-effect transistors
Claeys, Cor; Simoen, Eddy; Srinivasan, Purushothaman; Misra, D. (2007) -
Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks
Srinivasan, Purushothaman; Crupi, F.; Simoen, Eddy; Magnone, P.; Pace, C.; Misra, D.; Claeys, Cor (2007) -
l/f Noise performance of n-MOSFETs with Hf-based gate dielectrics
Srinivasan, P.; Simoen, Eddy; Pantisano, Luigi; Claeys, Cor; Misra, D. (2005)