Impact of gate material on low-frequency noise of n-MOSFETs with 1.5 nm SiON gate dielectric: testing the limits of the number fluctuations theory

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Authors
Srinivasan, Purushothaman; Simoen, Eddy; Pantisano, Luigi; Claeys, Cor; Misra, D.
Conference
Noise and Fluctuations: 18th International Conference on Noise and Fluctuations - ICNF
Title
Impact of gate material on low-frequency noise of n-MOSFETs with 1.5 nm SiON gate dielectric: testing the limits of the number fluctuations theory
Publication type
Proceedings paper
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